News | February 03, 2014
Scientist Introduces 4-D Brain Scanning Technology
February 3, 2014 — The Center for Tomography Research Laboratory (CTECH Labs) introduced its latest technology in brain scanning at the 6th International IEEE Engineering in Medicine and Biology Society Conference on Neural Engineering, San Diego, Calif., Nov. 7, 2013.
CTECH Labs developed Electrical Capacitance Volume Tomography (ECVT) to enable 4-D brain activity scanning. The technology offers low-cost, radiation-free, instantaneous detection of abnormalities in the brain caused by tumors, epilepsy, Alzheimer’s Disease and other brain dysfunctions.
The ECVT sensor system measures electrical signals of the brain and generates a volumetric map of brain activity, based on a Neural-Network Multi-criteria Optimization Image Reconstruction Technique (NN-MOIRT). The ECVT can detect brain tumors by examining brain functional abnormalities. The ECVT sensor design has been optimized to detect brain tumors in different sensitivity regions of the brain.
Warsito Purwo Taruno, founder and director of CTECH Labs, collaborated with The Ohio State University to develop ECVT in 2004. NASA uses the system to experiment with zero gravity fuel gauging, and the U.S. Department of Energy’s National Energy Technology Laboratory uses it to develop next-generation clean energy power plants.
ECVT enables doctors to observe the brain’s function in real time using computerized sensor systems. ECVT requires 5 volts and a non-invasive helmet scanner, and emits no radiation.
For more information: www.upenn.edu