April 30, 2014 — Kubtec announced it released the new Xpert 20 and Xpert 40 imaging systems. Redesigned with a sleeker, more ergonomic profile for improved functionality, the Xpert 20 and Xpert 40 offer the next step forward in digital specimen radiography.
The Xpert 20, with faster image acquisition time and advanced single wafer detector design, provides superior image quality and a field-of-view (FOV) 50 percent larger than what is typically available. With Kubtec’s Digicom, including Artemis image enhancement technology, the smallest micro-calcifications are visible.
The Xpert 40, with its redesigned profile, is the ideal tool for imaging excised breast tissue. Advanced mobility and the new height adjustable monitor offer the most effective and efficient tool for intraoperative imaging. With detector options up to 8 inches by 8 inches, radiologists, surgeons and pathologists can view larger excised tissue specimens for a detailed examination of margins.
For more information: www.kubtec.com